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  1. Spectroscopic Ellipsometer – Ellipsometry by HORIBA Jobin Yvon

    Ellipsometry - Accurate Spectroscopic Ellipsometers for Precise Film Thickness Measurements from HORIBA Jobin Yvon
    thin film1
    film thickness1
    ellipsometers1
    Spectroscopic ellipsometry1
    thin film measurement1
    film thickness measurement1
    DUV ellipsometers1
    NIR ellipsometers1
    spectroscopic ellipsometers1

    www.ellipsometer.net - 2009-02-12

  2. Axic Inc - Semiconductor Plasma, Rapid Thermal Processing and Thin Film Metrology Equipment Company Homepage

    AXIC, Inc manufactures and distributes semiconductor plasma processing equipment and Thin Film Metrology tools (Ellipsometer, Spectroscopic and Discrete ...
    Asher1
    PECVD1
    Thickness Measurement1
    Plasma etcher1
    refractive index1
    Reflectometer1
    ellipsometer1
    optical measurement1
    LPCVD1
    ellipsometry1
    Plasma etch1
    Spectroscopic Ellipsometry1
    Thin Film Measurement1
    Spectroscopic Ellipsometer1
    Thin Film Metrology1
    Photoresist stripping1
    Reactive ion etch1
    Plasma deposition1
    Rapid thermal annealing1
    Reactive ion etcher1
    Thin Film Analysis1
    Rapid thermal anneal1
    Resist stripper1
    X-ray fluoresence1
    Diode etcher0
    ICP etch0
    ICP etcher0
    ICP PECVD0
    Photoresist stripper0
    Plasma wafer backside thinning0
    Rapid thermal processor0

    www.axic.com - 2009-02-07

  3. LayTec – in-situ sensors for thin-film processes

    As a leader in the field of in-situ epitaxy sensors, LayTec offers a wide range of real-time monitoring tools for MOCVD, MBE and other thin-film processes. ...
    nanotechnology2
    semiconductors2
    LEDs2
    InP1
    GaN1
    GaAs1
    thin film deposition1
    epitaxy1
    MOCVD1
    VCSEL1
    MOVPE1
    thin film measurement1
    reflectometry1
    EpiR1
    optical monitoring1
    HBTs1
    growth monitoring1
    III-Vs1
    OMCVD1
    surface spectroscopy1
    thin film monitoring1
    EpiRAS1
    EpiTT1
    GaInNAs1
    in-situ tools1
    interface spectroscopy1
    LayTec1
    OMVPE1

    www.laytec-ag.com - 2009-02-10

  4. Welcome to Metrosol

    Metrosol develops, manufactures, and markets patented Short Wavelength Reflectometry (SWR) systems that extend the capability of traditional reflectometry, by ...
    short3
    optical2
    metrology2
    wavelength1
    thin film measurement1
    Metrosol1

    metrosol.com - 2009-03-04

  5. Engineer's Office for Applied Spectroscopy - Film Thickness Gauges, PDA Spectrometer, Plasma Monitoring

    We offer gauges for the photodiode array spectroscopy, film thickness measurement and plasma emission monitoring, especially for in-line measurement tasks.
    plasma2
    chamber2
    vacuum2
    emission2
    spectroscopy1
    white light1
    spectrometer1
    interference1
    photometer1
    spectrometry1
    emission control1
    thickness measurement1
    sputter1
    coating thickness1
    photodiode1
    thickness gauge1
    diode array1
    web coating1
    thin film measurement1
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    reflectometry1
    film thickness measurement1
    photodiode array1
    film thickness gauge1
    plasma control1
    web coater1
    white-light1
    film thickness gage0
    plasma emission0
    thin film gage0
    thin film gauge0

    www.applied-spectroscopy.com - 2009-02-07

  6. Filmetrics Thin Film Thickness Measurements, Thin Film Measurements

    Home About Us Technology Spectral Reflectance What We Measure Products Overview F10 F20 F30 F40/F42 F50/F60 F80 Accessories Applications Biomedical Displays ...
    map3
    polymer2
    semiconductor2
    gauge2
    process control2
    measure2
    layer1
    wafer1
    oxide1
    CMP1
    CVD1
    spectrometer1
    in-line1
    in-situ1
    polyimide1
    nitride1
    interferometry1
    photoresist1
    polysilicon1
    thickness measurement1
    uniformity1
    refractive index1
    ellipsometry1
    optical properties1
    thin film measurement1
    optical constants1
    integrated metrology1
    spectral reflectance1
    oxynitride1
    a-silicon1
    defect mapping1

    www.filmetrics-asia.com - 2009-02-13

  7. Filmetrics Thin Film Thickness Measurements, Thin Film Measurements

    Home About Us Technology Spectral Reflectance What We Measure Products Overview F10 F20 F30/F37 F40/F42 F50/F60 F80 Accessories Applications Biomedical Displays ...
    map3
    polymer2
    semiconductor2
    gauge2
    process control2
    measure2
    layer1
    wafer1
    oxide1
    CMP1
    CVD1
    spectrometer1
    in-line1
    in-situ1
    polyimide1
    nitride1
    interferometry1
    photoresist1
    polysilicon1
    thickness measurement1
    uniformity1
    refractive index1
    ellipsometry1
    optical properties1
    thin film measurement1
    optical constants1
    integrated metrology1
    spectral reflectance1
    oxynitride1
    a-silicon1
    defect mapping1

    www.filmetricseuropa.com - 2009-04-02

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